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Inductively Coupled Plasma-Mass Spectrometer (ICP-MS)

This equipment analyzes and evaluates trace elements required by the semiconductor industry.
The system is thoroughly managed in clean rooms to avoid extremely small amounts of contamination, enabling advanced analysis at several hundred ppm to sub-levels, such as cleaning qualities and post-product-use trace metal analysis.


The quotation and inquiries are available by the telephone /FAX or the mail .